Improved techniques for measuring x-ray mass attenuation coefficients

被引：5

作者：

de Jonge, MD ^{[1
]}

Tran, CQ ^{[1
]}

Chantler, CT ^{[1
]}

Barnea, Z ^{[1
]}

机构：

[1] Univ Melbourne, Melbourne, Vic 3010, Australia

来源：

OPTICAL ENGINEERING | 2006年 / 45卷 / 04期

基金：

澳大利亚研究理事会;

关键词：

mass attenuation coefficient; atomic form factor; x-ray extended-range techniques;

D O I：

10.1117/1.2190647

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We apply the x-ray extended-range technique (XERT) to measure mass attenuation coefficients over one order of magnitude more accurately than previously reported in the literature. We describe the application of the XERT to the investigation of systematic effects due to harmonic energy components in the x-ray beam, scattering and fluorescence from the absorbing sample, the bandwidth of the x-ray beam, and thickness variations across the absorber. The high-accuracy measurements are used for comparison with different calculations of mass attenuation coefficients, and to identify particular regions where these calculations fail. (c) 2006 Society of Photo-Optical Instrumentation Engineers.

引用

页数：8

共 41 条

[1] Measurement of the mass attenuation coefficient for elemental materials in the range 6 ≤, Z ≤ 82 using X-rays from 13 up to 50 kev [J].