Uniform high-reflectivity silver film deposited by planar magnetron sputtering

被引:21
作者
Mao, Liyang [1 ,2 ]
Geng, Yanquan [1 ,2 ]
Cao, Yongzhi [2 ]
Yan, Yongda [1 ,2 ]
机构
[1] Harbin Inst Technol, Inst Robot, State Key Lab Robot & Syst, Harbin 150080, Heilongjiang, Peoples R China
[2] Harbin Inst Technol, Ctr Precis Engn, Harbin 150001, Heilongjiang, Peoples R China
基金
中国博士后科学基金;
关键词
Magnetron sputtering; High reflectivity silver film; Aluminum alloy substrate; Gas pressure; Thickness distribution; Complex optical element;
D O I
10.1016/j.vacuum.2020.109999
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Following the development of various complex optical elements, especially those involving aluminum alloys with several free-form surfaces, it is critical to understand the material coating methods. This report provides guidance for coating aluminum alloy optical elements containing four free-form surfaces with reflective silver films. To determine a proper film deposition thickness with high reflectivity applied by magnetron sputtering, a model is proposed to explain how the reflectivity is affected by the thickness of the silver film on the aluminum alloy substrates. Additionally, to optimize the uniformity of film thickness deposited from a magnetron source, a more accurate distribution model was developed by introducing gas pressure parameters. This modified model provides excellent agreement between simulated and experimental results. Finally, the film thickness distribution on the optical element integrated with four free-form surfaces is simulated using the modified model, and the influence of the relative position of sources and substrates on the film thickness uniformity is explored.
引用
收藏
页数:9
相关论文
共 34 条
[1]   Investigation of Optical Transmission in Thin Metal Films [J].
Axelevitch, A. ;
Gorenstein, B. ;
Golan, G. .
18TH INTERNATIONAL VACUUM CONGRESS (IVC-18), 2012, 32 :1-13
[2]   Three-dimensional thickness and property distribution of TiC films deposited by DC magnetron sputtering and HIPIMS [J].
Balzer, Martin ;
Fenker, Martin .
SURFACE & COATINGS TECHNOLOGY, 2014, 250 :37-43
[3]   Development, fabrication, and testing of an anamorphic imaging snap-together freeform telescope [J].
Beier, Matthias ;
Hartung, Johannes ;
Peschel, Thomas ;
Damm, Christoph ;
Gebhardt, Andreas ;
Scheiding, Sebastian ;
Stumpf, Daniela ;
Zeitner, Uwe D. ;
Risse, Stefan ;
Eberhardt, Ramona ;
Tuennermann, Andreas .
APPLIED OPTICS, 2015, 54 (12) :3530-3542
[4]   FORMATION AND GROWTH OF TARNISH ON EVAPORATED SILVER FILMS [J].
BENNETT, HE ;
PECK, RL ;
BURGE, DK ;
BENNETT, JM .
JOURNAL OF APPLIED PHYSICS, 1969, 40 (08) :3351-&
[5]   Protected-silver coatings for the 8-m Gemini telescope mirrors [J].
Boccas, M ;
Vucina, T ;
Araya, C ;
Vera, E ;
Ahhee, C .
THIN SOLID FILMS, 2006, 502 (1-2) :275-280
[6]   Magnetron sputtering - Milestones of 30 years [J].
Braeuer, G. ;
Szyszka, B. ;
Vergoehl, M. ;
Bandorf, R. .
VACUUM, 2010, 84 (12) :1354-1359
[7]   Achieving desired thickness gradients on flat and curved substrates [J].
Broadway, DM ;
Platonov, YY ;
Gomez, LA .
X-RAY OPTICS, INSTRUMENTS, AND MISSIONS II, 1999, 3766 :262-274
[8]   Thickness and microstructure effects in the optical and electrical properties of silver thin films [J].
Ding, Guowen ;
Clavero, Cesar ;
Schweigert, Daniel ;
Minh Le .
AIP ADVANCES, 2015, 5 (11)
[9]   COMPUTER-SIMULATION OF FILM THICKNESS DISTRIBUTION IN SYMMETRICAL MAGNET MAGNETRON SPUTTERING [J].
FAN, QH ;
CHEN, XH ;
ZHANG, Y .
VACUUM, 1995, 46 (03) :229-232
[10]   Manufacturing and measurement of freeform optics [J].
Fang, F. Z. ;
Zhang, X. D. ;
Weckenmann, A. ;
Zhang, G. X. ;
Evans, C. .
CIRP ANNALS-MANUFACTURING TECHNOLOGY, 2013, 62 (02) :823-846