Failure Case Analysis of Quartz Crystal Based on Failure Mechanism

被引：0

作者：

Jia-yong, Zhong ^{[1
]}

You-qiang, Zhang ^{[1
]}

Zu-jian, Liu ^{[1
]}

Hong-xin, Yu ^{[1
]}

Tie-zhu, Chen ^{[2
]}

Sheng-zong, He ^{[2
]}

Lin, Hu ^{[2
]}

Sheng-jun, Yuan ^{[3
]}

Zhi-fan, Yang ^{[3
]}

机构：

[1] Elect Power Co, Res Inst, State Grid Chongqing, Chongqing, Peoples R China

[2] China CEPREI Lab, Reliabil Anal Ctr, Guangzhou, Guangdong, Peoples R China

[3] Chongqing CEPREI Ind Technol Res Inst, Chongqing, Peoples R China

来源：

2017 18TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT) | 2017年

关键词：

quartz crystal; reliability; frequency drift; failure analysis; failure mechanism;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper collected and classified the failure modes and mechanisms of quartz crystals from actual engineering application. Through related failure analysis cases, combined with scanning electron microscopy and energy spectrum analysis, failure analysis results of quartz crystals of common failure mechanism were presented and studied. The quality and process controlling and reliability screening methods were suggested.

引用

页码：1442 / 1445

页数：4

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