Critical Current in YBCO Coated Conductors in the Presence of a Macroscopic Defect

被引：10
|
作者：
Polak, Milan [1 ]
Barnes, Paul N. [2 ]
Mozola, Pavol [1 ]
Levin, George A. [2 ]
机构：
[1] Slovak Acad Sci, Inst Elect Engn, SK-84104 Bratislava, Slovakia
[2] USAF, Res Lab, Wright Patterson AFB, OH 45433 USA
来源：
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 2009年 / 19卷 / 03期
关键词：
Coated conductors; defects; HTS; YBCO;
D O I：
10.1109/TASC.2009.2019090
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We have studied the effects of localized defects in the YBCO coated conductors on the critical current. The artificial defects were introduced into 4, 10 and 12 mm wide tapes as cuts of various lengths made either by laser ablation or mechanical means. Transport measurements were carried out in an external variable magnetic field to obtain the I-V characteristics of the damaged areas. The distribution of the magnetic field in the vicinity of the defects has been mapped as well. The reduction of the critical current by the defects, with and without an external DC magnetic field are discussed and compared with existing theories. A criterion for determining the critical current in the area containing a defect is suggested.
引用
收藏
页码：2921 / 2924
页数：4
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