Stable line defects in silicene

被引:22
作者
Ghosh, Dibyajyoti [1 ]
Parida, Prakash [2 ]
Pati, Swapan K. [3 ]
机构
[1] JNCASR, Chem & Phys Mat Unit, Bangalore 560064, Karnataka, India
[2] Univ Regensburg, Inst Theoret Phys, D-93040 Regensburg, Germany
[3] JNCASR, Theoret Sci Unit, Bangalore 560064, Karnataka, India
关键词
BORON-NITRIDE; MOLECULAR-DYNAMICS; GRAPHENE; STATES; FERROMAGNETISM; NANORIBBONS; TRANSPORT; GRAPHITE; RIPPLES; HYBRID;
D O I
10.1103/PhysRevB.92.195136
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Line defects in two-dimensional (2D) materials greatly modulate various properties of their pristine form. Using ab initio molecular dynamics (AIMD) simulations, we investigate the structural reconstructions of different kinds of grain boundaries in the silicene sheets. It is evident that depending upon the presence of silicon adatoms and edge shape of grain boundaries (i.e., armchair or zigzag), stable extended line defects (ELDs) can be introduced in a controlled way. Further studies show the stability of these line-defects in silicene, grown on Ag(111) surface at room-temperature. Importantly, unlike most of the 2D sheet materials such as graphene and hexagonal boron nitride, 5-5-8 line defects modify the nonmagnetic semimetallic pristine silicene sheet to spin-polarized metal. As ferromagnetically ordered magnetic moments remain strongly localized at the line defect, a one-dimensional spin channel gets created in silicene. Interestingly, these spin channels are quite stable because, unlike the edge of nanoribbons, structural reconstruction or contamination cannot destroy the ordering of magnetic moments here. Zigzag silicene nanoribbons with a 5-5-8 line defect also exhibit various interesting electronic and magnetic properties depending upon their width as well as the nature of the magnetic coupling between edge and defect spin states. Upon incorporation of other ELDs, such as 4-4-4 and 4-8 defects, 2D sheets and nanoribbons of silicene show a nonmagnetic metallic or semiconducting ground state. Highlighting the controlled formation of ELDs and consequent emergence of technologically important properties in silicene, we propose new routes to realize silicene-based nanoelectronic and spintronic devices.
引用
收藏
页数:11
相关论文
共 68 条
[1]   Correlated Magnetic States in Extended One-Dimensional Defects in Graphene [J].
Alexandre, Simone S. ;
Lucio, A. D. ;
Castro Neto, A. H. ;
Nunes, R. W. .
NANO LETTERS, 2012, 12 (10) :5097-5102
[2]  
Banhart F, 2011, ACS NANO, V5, P26, DOI [10.1021/nn102598m, 10.1016/B978-0-08-102053-1.00005-3]
[3]   PROJECTOR AUGMENTED-WAVE METHOD [J].
BLOCHL, PE .
PHYSICAL REVIEW B, 1994, 50 (24) :17953-17979
[4]   Ripples and Layers in Ultrathin MoS2 Membranes [J].
Brivio, Jacopo ;
Alexander, Duncan T. L. ;
Kis, Andras .
NANO LETTERS, 2011, 11 (12) :5148-5153
[5]   Two- and One-Dimensional Honeycomb Structures of Silicon and Germanium [J].
Cahangirov, S. ;
Topsakal, M. ;
Akturk, E. ;
Sahin, H. ;
Ciraci, S. .
PHYSICAL REVIEW LETTERS, 2009, 102 (23)
[6]   Room-temperature ferromagnetism in graphite driven by two-dimensional networks of point defects [J].
Cervenka, J. ;
Katsnelson, M. I. ;
Flipse, C. F. J. .
NATURE PHYSICS, 2009, 5 (11) :840-844
[7]   First-principles study of metal adatom adsorption on graphene [J].
Chan, Kevin T. ;
Neaton, J. B. ;
Cohen, Marvin L. .
PHYSICAL REVIEW B, 2008, 77 (23)
[8]   Controlled growth of a line defect in graphene and implications for gate-tunable valley filtering [J].
Chen, J. -H. ;
Autes, G. ;
Alem, N. ;
Gargiulo, F. ;
Gautam, A. ;
Linck, M. ;
Kisielowski, C. ;
Yazyev, O. V. ;
Louie, S. G. ;
Zettl, A. .
PHYSICAL REVIEW B, 2014, 89 (12)
[9]   Evidence for Dirac Fermions in a Honeycomb Lattice Based on Silicon [J].
Chen, Lan ;
Liu, Cheng-Cheng ;
Feng, Baojie ;
He, Xiaoyue ;
Cheng, Peng ;
Ding, Zijing ;
Meng, Sheng ;
Yao, Yugui ;
Wu, Kehui .
PHYSICAL REVIEW LETTERS, 2012, 109 (05)
[10]   Local Electronic Properties of Corrugated Silicene Phases [J].
Chiappe, Daniele ;
Grazianetti, Carlo ;
Tallarida, Grazia ;
Fanciulli, Marco ;
Molle, Alessandro .
ADVANCED MATERIALS, 2012, 24 (37) :5088-5093