Improving the energy resolution of bent crystal X-ray spectrometers with position-sensitive detectors

被引：15

作者：

Honkanen, Ari-Pekka ^{[1
]}

Verbeni, Roberto ^{[2
]}

Simonelli, Laura ^{[2
,3
]}

Sala, Marco Moretti ^{[2
]}

Al-Zein, Ali ^{[2
]}

Krisch, Michael ^{[2
]}

Monaco, Giulio ^{[2
,4
]}

Huotari, Simo ^{[1
]}

机构：

[1] Dept Phys, FI-00014 Helsinki, Finland

[2] European Synchrotron Radiat Facil, F-38043 Grenoble, France

[3] CELLS ALBA, Barcelona 08290, Spain

[4] Univ Trento, Dept Phys, I-38123 Povo, TN, Italy

来源：

JOURNAL OF SYNCHROTRON RADIATION | 2014年 / 21卷

基金：

芬兰科学院;

关键词：

X-ray spectrometers; position-sensitive detectors; bent analyser crystals; DYNAMICAL THEORY; REFLECTIVITY; DIFFRACTION; SCATTERING; EXAFS;

D O I：

10.1107/S1600577514011163

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Wavelength-dispersive high-resolution X-ray spectrometers often employ elastically bent crystals for the wavelength analysis. In a preceding paper [Honkanen et al. (2014). J. Synchrotron Rad. 21, 104-110] a theory for quantifying the internal stress of a macroscopically large spherically curved analyser crystal was presented. Here the theory is applied to compensate for the corresponding decrease of the energy resolution. The technique is demonstrated with a Johann-type spectrometer using a spherically bent Si(660) analyser in near-backscattering geometry, where an improvement in the energy resolution from 1.0 eV down to 0.5 eV at 9.7 keV incident photon energy was observed.

引用

页码：762 / 767

页数：6

共 22 条

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