Water-assisted femtosecond laser drilling of 4H-SiC to eliminate cracks and surface material shedding

被引:44
作者
Wang, Wenjun [1 ,2 ]
Song, Hongwei [1 ,2 ]
Liao, Kai [1 ,2 ]
Mei, Xuesong [1 ,2 ]
机构
[1] Xi An Jiao Tong Univ, State Key Lab Mfg Syst Engn, Xian 710049, Peoples R China
[2] Xi An Jiao Tong Univ, Shaanxi Key Lab Intelligent Robots, Xian 710049, Peoples R China
基金
国家重点研发计划;
关键词
Femtosecond laser drilling; 4H-SiC; High-aspect-ratio through holes; Water-assisted laser processing; Cracks; Surface material shedding; SILICON-CARBIDE; HOLES; FABRICATION; ABLATION; MEMS;
D O I
10.1007/s00170-020-06262-1
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
This study adopted femtosecond laser with a wavelength of 515 nm to drill high-aspect-ratio micro through holes on a 500-mu m thickness single-crystal SI-type 4H-SiC wafer. Firstly, through holes with a high aspect ratio of 20 were fabricated in air. However, the heat affect zone (HAZ), cracks, and surface material shedding around entrances and exits of the holes are inevitable in air even after chemical corrosion post-processing. In order to remove these defects, the water-assisted femtosecond laser drilling of 4H-SiC was investigated. The high-quality through holes free of cracks, surface material shedding, and HAZ were obtained under the action of internal scour and heat diffusion of water. Besides, the water layer thickness and the laser repetition frequency have a great influence on the processing quality and efficiency of the micro-holes. Finally, high-quality high-ratio-rate through micro-hole arrays on 4H-SiC were fabricated with the optimal process parameters, which is significant for the development of SiC electronic devices and the high-quality micro-fabrication of other hard and brittle materials.
引用
收藏
页码:553 / 562
页数:10
相关论文
共 47 条
[41]   Two-step femtosecond laser etching for bulk micromachining of 4H-SiC membrane applied in pressure sensing [J].
Wang, Lukang ;
Zhao, You ;
Yang, Yu ;
Zhao, Yulong .
CERAMICS INTERNATIONAL, 2022, 48 (09) :12359-12367
[42]   Material removal of single crystal 4H-SiC wafers in hybrid laser-waterjet micromachining process [J].
Feng, Shaochuan ;
Huang, Chuanzhen ;
Wang, Jun ;
Zhu, Hongtao .
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 2018, 82 :112-125
[43]   Study of damage mechanism on single crystal 4H-SiC surface layer by picosecond laser modification (PLM) [J].
Liu, Haixu ;
Li, Zhipeng ;
Zhang, Ping ;
Zuo, Dunwen ;
Xie, Wenkun .
APPLIED SURFACE SCIENCE, 2024, 672
[44]   Surface micromorphology and nanostructures evolution in hybrid laser processes of slicing and polishing single crystal 4H-SiC [J].
Li, Yuhang ;
Zhang, Zhe ;
Song, Qi ;
Shi, Haiyan ;
Hou, Yu ;
Yue, Song ;
Wang, Ran ;
Cai, Shunshuo ;
Zhang, Zichen .
JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY, 2024, 184 :235-244
[45]   Dominant factors and their action mechanisms on material removal rate in electrochemical mechanical polishing of 4H-SiC (0001) surface [J].
Yang, Xiaozhe ;
Yang, Xu ;
Kawai, Kentaro ;
Arima, Kenta ;
Yamamura, Kazuya .
APPLIED SURFACE SCIENCE, 2021, 562
[46]   Controlling periodic ripple microstructure formation on 4H-SiC crystal with three time-delayed femtosecond laser beams of different linear polarizations [J].
He, Wanlin ;
Yang, Jianjun ;
Guo, Chunlei .
OPTICS EXPRESS, 2017, 25 (05) :5156-5168
[47]   Experimental studies on water vapor plasma oxidation and thermal oxidation of 4H-SiC (0001) for clarification of the atomic-scale flattening mechanism in plasma assisted polishing [J].
Deng, Hui ;
Endo, Katsuyoshi ;
Yamamura, Kazuya .
SILICON CARBIDE AND RELATED MATERIALS 2013, PTS 1 AND 2, 2014, 778-780 :587-590