Water-assisted femtosecond laser drilling of 4H-SiC to eliminate cracks and surface material shedding

被引:44
作者
Wang, Wenjun [1 ,2 ]
Song, Hongwei [1 ,2 ]
Liao, Kai [1 ,2 ]
Mei, Xuesong [1 ,2 ]
机构
[1] Xi An Jiao Tong Univ, State Key Lab Mfg Syst Engn, Xian 710049, Peoples R China
[2] Xi An Jiao Tong Univ, Shaanxi Key Lab Intelligent Robots, Xian 710049, Peoples R China
基金
国家重点研发计划;
关键词
Femtosecond laser drilling; 4H-SiC; High-aspect-ratio through holes; Water-assisted laser processing; Cracks; Surface material shedding; SILICON-CARBIDE; HOLES; FABRICATION; ABLATION; MEMS;
D O I
10.1007/s00170-020-06262-1
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
This study adopted femtosecond laser with a wavelength of 515 nm to drill high-aspect-ratio micro through holes on a 500-mu m thickness single-crystal SI-type 4H-SiC wafer. Firstly, through holes with a high aspect ratio of 20 were fabricated in air. However, the heat affect zone (HAZ), cracks, and surface material shedding around entrances and exits of the holes are inevitable in air even after chemical corrosion post-processing. In order to remove these defects, the water-assisted femtosecond laser drilling of 4H-SiC was investigated. The high-quality through holes free of cracks, surface material shedding, and HAZ were obtained under the action of internal scour and heat diffusion of water. Besides, the water layer thickness and the laser repetition frequency have a great influence on the processing quality and efficiency of the micro-holes. Finally, high-quality high-ratio-rate through micro-hole arrays on 4H-SiC were fabricated with the optimal process parameters, which is significant for the development of SiC electronic devices and the high-quality micro-fabrication of other hard and brittle materials.
引用
收藏
页码:553 / 562
页数:10
相关论文
共 47 条
[31]   High-quality structures on 4H-SiC fabricated by femtosecond laser LIPSS and chemical etching [J].
Liang, Yan-Cheng ;
Li, Yi-En ;
Liu, Yi-Hsien ;
Kuo, Jia-Fan ;
Cheng, Chung-Wei ;
Lee, An-Chen .
OPTICS AND LASER TECHNOLOGY, 2023, 163
[32]   Cross-Sectional TEM Analysis of Structural Change in 4H-SiC Single Crystal Irradiated by Femtosecond Laser Pulses [J].
Kawahara, Hiroyuki ;
Okada, Tatsuya ;
Kumai, Ryota ;
Tomita, Takuro ;
Matsuo, Shigeki ;
Hashimoto, Shuichi ;
Yamaguchi, Makoto .
SILICON CARBIDE AND RELATED MATERIALS 2007, PTS 1 AND 2, 2009, 600-603 :883-+
[33]   Influence of Surface Preprocessing on 4H-SiC Wafer Slicing by Using Ultrafast Laser [J].
Wang, Hanwen ;
Chen, Qiu ;
Yao, Yongping ;
Che, Linlin ;
Zhang, Baitao ;
Nie, Hongkun ;
Wang, Rongkun .
CRYSTALS, 2023, 13 (01)
[34]   Nanosecond laser irradiation assisted chemical mechanical polishing (CMP) process for promoting material removal of single crystal 4H-SiC [J].
Wang, Zirui ;
Wang, Yongguang ;
He, Haidong ;
Chen, Feng ;
Shi, Jiacen ;
Peng, Yang ;
Zhang, Tianyu ;
Zhu, Rui .
CERAMICS INTERNATIONAL, 2024, 50 (19) :34702-34709
[35]   Confocal photoluminescence characterization of silicon-vacancy color centers in 4H-SiC fabricated by a femtosecond laser [J].
Liu, Jiayu ;
Xu, Zongwei ;
Song, Ying ;
Wang, Hong ;
Dong, Bing ;
Li, Shaobei ;
Ren, Jia ;
Li, Qiang ;
Rommel, Mathias ;
Gu, Xinhua ;
Liu, Bowen ;
Hu, Minglie ;
Fang, Fengzhou .
NANOTECHNOLOGY AND PRECISION ENGINEERING, 2020, 3 (04) :218-228
[36]   length Fabrication of high aspect ratio and low taper angle micro-holes utilizing complex water-assisted femtosecond laser drilling [J].
Zhang, Rui ;
Zhang, Hailong ;
Ke, Ronghe ;
Wang, Xingsheng .
OPTICS AND LASER TECHNOLOGY, 2025, 185
[37]   Ablation threshold measurements and surface modifications of 193 nm laser irradiated 4H-SiC [J].
Mohammed, A. F. ;
Al-Jarwany, Q. A. ;
Clarke, A. J. ;
Amaral, T. M. ;
Lawrence, J. ;
Kemp, N. T. ;
Walton, C. D. .
CHEMICAL PHYSICS LETTERS, 2018, 713 :194-202
[38]   Numerical Simulation and Experimental Investigation of ps Pulsed Laser Modification inside 4H-SiC Material [J].
Song, Yiying ;
Zhao, Shusen ;
He, Hongzhi ;
Liang, Han ;
Dai, Zhanfeng ;
Lin, Xuechun ;
Zhang, Guling .
PHOTONICS, 2024, 11 (02)
[39]   Effects of picosecond laser ablation and surface modification on the surface/interface characteristics and removal performance of 4H-SiC [J].
Zhang, Qixian ;
Li, Kangsen ;
Zhang, Xiong ;
Gao, Rui ;
Cheung, Chi Fai ;
Wang, Chunjin .
JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY, 2025, 234 :199-216
[40]   Selective electrochemical mechanical polishing of 4H-SiC surface employing porous material impregnated with electrolyte [J].
Yang, Xiaozhe ;
Yang, Xu ;
Jiang, Zhuangde ;
Yamamura, Kazuya .
CERAMICS INTERNATIONAL, 2023, 49 (22) :34569-34581