Orientation Mapping via Precession-Enhanced Electron Diffraction and Its Applications in Materials Science

被引：38

作者：

Brons, J. G. ^{[1
]}

Thompson, G. B. ^{[1
]}

机构：

[1] Univ Alabama, Dept Mat & Met Engn, Tuscaloosa, AL 35487 USA

来源：

JOM | 2014年 / 66卷 / 01期

基金：

美国国家科学基金会;

关键词：

BOUNDARY-CHARACTER-DISTRIBUTION; BACKSCATTER DIFFRACTION; SPATIAL-RESOLUTION; CRITICAL-VOLTAGE; MICROSCOPY; EVOLUTION; REFINEMENT; MECHANISMS; CRYSTALS; TEXTURE;

D O I：

10.1007/s11837-013-0799-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Precession-enhanced diffraction (PED) is a transmission electron microscopy technique that allows for pseudo-kinematical diffraction conditions to occur. Using collected spot patterns, PED has successfully been demonstrated to provide for phase and orientation mapping in a variety of materials. One major advantage of PED is the fine spatial resolution, on the order of a few nanometers, allowing previously inaccessible grain boundary orientation mapping of nanostructured materials to be realized. This article provides a basic overview of the emerging technique with selected highlights of its application to materials science and engineering.

引用

页码：165 / 170

页数：6

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