Orientation Mapping via Precession-Enhanced Electron Diffraction and Its Applications in Materials Science

被引：38
|
作者：
Brons, J. G. [1 ]
Thompson, G. B. [1 ]
机构：
[1] Univ Alabama, Dept Mat & Met Engn, Tuscaloosa, AL 35487 USA
来源：
JOM | 2014年 / 66卷 / 01期
基金：
美国国家科学基金会;
关键词：
BOUNDARY-CHARACTER-DISTRIBUTION; BACKSCATTER DIFFRACTION; SPATIAL-RESOLUTION; CRITICAL-VOLTAGE; MICROSCOPY; EVOLUTION; REFINEMENT; MECHANISMS; CRYSTALS; TEXTURE;
D O I：
10.1007/s11837-013-0799-5
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Precession-enhanced diffraction (PED) is a transmission electron microscopy technique that allows for pseudo-kinematical diffraction conditions to occur. Using collected spot patterns, PED has successfully been demonstrated to provide for phase and orientation mapping in a variety of materials. One major advantage of PED is the fine spatial resolution, on the order of a few nanometers, allowing previously inaccessible grain boundary orientation mapping of nanostructured materials to be realized. This article provides a basic overview of the emerging technique with selected highlights of its application to materials science and engineering.
引用
收藏
页码：165 / 170
页数：6
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