Noise Analysis for Time-Domain Circuits

被引：0
|
作者：
Ghanad, Mehrdad A. [1 ]
Dehollain, Catherine [1 ]
Green, Michael M. [2 ]
机构：
[1] Ecole Polytech Fed Lausanne, RFIC Grp, CH-1015 Lausanne, Switzerland
[2] Univ Calif Irvine, Dept Elect Engn & Comp Sci, Irvine, CA 92697 USA
来源：
2015 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS) | 2015年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A charge integrator is an essential building block used in time-based ADCs and sensor readout circuits. In this paper, time-domain noise analysis is used to calculate the effect of all noise sources, including 1/f noise, on the voltage noise variance of the integrator. The results show that for short charge integration intervals, the contribution of 1/f noise sources to the total voltage variance of the integrator is not significant. Different design trade-offs for optimally choosing the capacitance of the integrator and current mirror ratio are discussed. The accuracy of the developed equations is verified by transient noise simulations.
引用
收藏
页码：149 / 152
页数：4
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