Submicron metal-semiconductor-metal ultraviolet detectors based on AlGaN grown on silicon: Results and simulation

被引:29
作者
Duboz, JY
Reverchon, JL
Adam, D
Damilano, B
Grandjean, N
Semond, F
Massies, J
机构
[1] Thales Res & Technol, F-91404 Orsay, France
[2] CNRS, CRHEA, F-06560 Valbonne, France
关键词
D O I
10.1063/1.1499741
中图分类号
O59 [应用物理学];
学科分类号
摘要
Solar blind metal-semiconductor-metal detectors have been fabricated based on AlGaN grown on Si by molecular-beam epitaxy. Submicron finger spacings were obtained by electron-beam lithography, and allowed us to demonstrate a significant improvement of the responsivity and the spectral selectivity. These results were explained by numerical two-dimensional calculations of the electric-field distribution. The simulation also explained the dependence of the response on applied bias. (C) 2002 American Institute of Physics.
引用
收藏
页码:5602 / 5604
页数:3
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