A high resolution magnetic spectrograph for ion beam analysis

被引：27

作者：

Arnoldbik, WM ^{[1
]}

Wolfswinkel, W ^{[1
]}

Inia, DK ^{[1
]}

Verleun, VCG ^{[1
]}

Lobner, S ^{[1
]}

Reinders, JA ^{[1
]}

Labohm, F ^{[1
]}

Boerma, DO ^{[1
]}

机构：

[1] UNIV GRONINGEN, DEPT NUCL SOLID STATE PHYS, NL-9747 AG GRONINGEN, NETHERLANDS

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1996年 / 118卷 / 1-4期

关键词：

D O I：

10.1016/0168-583X(96)00259-5

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A magnetic spectrograph especially designed for interface and thin film analysis has been installed at the 6.5 MV tandem accelerator of the University of Utrecht. It is provided with a Wien filter, so that both the mass and the charge of the ions arriving in the focal plane is determined. In the focal plane a two-dimensional position-sensitive detector is used to obtain spectra with resolved energy along one axis, and resolved angles (perpendicular to the scattering plane) along the other axis, A special bellows construction allows the spectrograph to be rotated over an angular range of 120 degrees while maintaining the ultra-high vacuum conditions. The first results of RBS and ERD measurements are presented.

引用

页码：566 / 572

页数：7

共 6 条

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