Modelling Neutron Interactions in the Imaging SEE Monitor

被引：5

作者：

Cai, Xiao Xiao ^{[1
]}

Platt, S. P. ^{[1
]}

Chen, Wei ^{[2
]}

机构：

[1] Univ Cent Lancashire, Sch Comp Engn & Phys Sci, Preston PR1 2HE, Lancs, England

[2] NW Inst Nucl Technol, Xian 710024, Peoples R China

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2009年 / 56卷 / 04期

关键词：

Accelerated testing; neutron radiation effects; MONOENERGETIC NEUTRON; CHARGE-COLLECTION; SINGLE; DEPENDENCE; IMAGES; UPSET; BEAM;

D O I：

10.1109/TNS.2009.2020984

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Geant4 is used to simulate neutron interactions in an Imaging Single-Event Effect Monitor. Results are compared to measured data gathered during accelerated testing in neutron beams and during exposure to the cosmogenic neutron field.

引用

页码：2035 / 2041

页数：7

共 37 条

[1] Geant4 developments and applications [J].

Allison, J ;

Amako, K ;

Apostolakis, J ;

Araujo, H ;

Dubois, PA ;

Asai, M ;

Barrand, G ;

Capra, R ;

Chauvie, S ;

Chytracek, R ;

Cirrone, GAP ;

Cooperman, G ;

Cosmo, G ;

Cuttone, G ;

Daquino, GG ;

Donszelmann, M ;

Dressel, M ;

Folger, G ;

Foppiano, F ;

Generowicz, J ;

Grichine, V ;

Guatelli, S ;

Gumplinger, P ;

Heikkinen, A ;

Hrivnacova, I ;

Howard, A ;

Incerti, S ;

Ivanchenko, V ;

Johnson, T ;

Jones, F ;

Koi, T ;

Kokoulin, R ;

Kossov, M ;

Kurashige, H ;

Lara, V ;

Larsson, S ;

Lei, F ;

Link, O ;

Longo, F ;

Maire, M ;

Mantero, A ;

Mascialino, B ;

McLaren, I ;

Lorenzo, PM ;

Minamimoto, K ;

Murakami, K ;

Nieminen, P ;

Pandola, L ;

Parlati, S ;

Peralta, L .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2006, 53 (01) :270-278

[2] Facility for fast neutron irradiation tests of electronics at the ISIS spallation neutron source [J].

Andreani, C. ;

Pietropaolo, A. ;

Salsano, A. ;

Gorini, G. ;

Tardocchi, M. ;

Paccagnella, A. ;

Gerardin, S. ;

Frost, C. D. ;

Ansell, S. ;

Platt, S. P. .

APPLIED PHYSICS LETTERS, 2008, 92 (11)

[3] Single event upsets induced by 1-10 MeV neutrons in static-RAMs using mono-energetic neutron sources [J].

Baggio, J. ;

Lambert, D. ;

Ferlet-Cavrois, V. ;

Paillet, P. ;

Marcandella, C. ;

Duhamel, O. .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2007, 54 (06) :2149-2155

[4] Improved capabilities for proton and neutron irradiations at TRIUMF [J].

Blackmore, EW ;

Dodd, PE ;

Shaneyfelt, MR .

2003 IEEE RADIATION EFFECTS DATA WORKSHOP RECORD, 2003, :149-155

[5] Analyses of images of neutron interactions and single particle displacement damage in CCD Arrays [J].

Chugg, AA ;

Jones, R ;

Moutrie, MJ ;

Truscott, PR .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2004, 51 (06) :3579-3584

[6] Analyses of CCD images of nucleon-silicon interaction events [J].

Chugg, AM ;

Jones, R ;

Moutrie, MJ ;

Dyer, CS ;

Ryden, KA ;

Truscott, PR ;

Armstrong, JR ;

King, DBS .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2004, 51 (05) :2851-2856

[7] Single particle dark current spikes induced in CCDs by high energy neutrons [J].

Chugg, AM ;

Jones, R ;

Moutrie, MJ ;

Armstrong, JR ;

King, DBS ;

Moreau, N .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2003, 50 (06) :2011-2017

[8]

CICCARELLI A, 2002, P SOC PHOTO-OPT INS, V4699, P153

[9] LET dependence of the charge collection efficiency of silicon microdosimeters [J].

Cornelius, IM ;

Rosenfeld, AB ;

Siegele, R ;

Cohen, DD .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2003, 50 (06) :2373-2379

[10]

DUNNE P, 2005, THESIS CENTRAL LANCA

← 1 2 3 4 →