Magnetic properties, morphology and interfaces of (Fe/Si)n nanostructures

被引：5

作者：

Bartolome, J. ^{[1
,2
]}

Badia-Romano, L. ^{[1
,2
]}

Rubin, J. ^{[1
,3
]}

Bartolome, F. ^{[1
,2
]}

Varnakov, S. N. ^{[4
]}

Ovchinnikov, S. G. ^{[4
]}

Buergler, D. E. ^{[5
]}

机构：

[1] Univ Zaragoza, CSIC, Inst Ciencia Mat Aragon, E-50009 Zaragoza, Spain

[2] Univ Zaragoza, Dept Fis Mat Condensada, E-50009 Zaragoza, Spain

[3] Univ Zaragoza, Dept Ciencia Mat & Ingn Met, E-50018 Zaragoza, Spain

[4] RAS, Kirensky Inst Phys SB, Krasnoyarsk 660036, Russia

[5] Forschungszentrum Julich GmbH, Peter Grunberg Inst PGI 6, D-52425 Julich, Germany

来源：

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 2016年 / 400卷

基金：

奥地利科学基金会;

关键词：

INTERLAYER EXCHANGE; FE/SI(100) INTERFACE; SILICIDE FORMATION; ULTRAHIGH-VACUUM; FILMS; IRON; MAGNETORESISTANCE; SUPERLATTICES; SPECTROSCOPY; DEPOSITION;

D O I：

10.1016/j.jmmm.2015.07.046

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A systematic study of the iron-silicon interfaces formed upon preparation of (Fe/Si) multilayers has been performed by the combination of modern and powerful techniques. Samples were prepared by molecular beam epitaxy under ultrahigh vacuum onto Si wafers or single crystalline Ag(100) buffer layers grown on GaAs(100). The morphology of these films and their interfaces was studied by a combination of scanning transmission electron microscopy. X-ray reflectivity, angle resolved X-ray photoelectron spectroscopy and hard X-ray photoelectron spectroscopy. The Si-on-Fe interface thickness and roughness were determined to be 1.4(1) nm and 0.6(1) nm, respectively. Moreover, determination of the stable phases formed at both Fe-on-Si and Si-on-Fe interfaces was performed using conversion electron Mossbauer spectroscopy on multilayers with well separated Si-on-Fe and Fe-on-Si interfaces. It is shown that while a fraction of Fe remains as alpha-Fe, the rest has reacted with Si, forming the paramagnetic FeSi phase and a ferromagnetic Fe rich silicide. We conclude that there is an identical paramagnetic c-Fe1-xSi silicide sublayer in both Si-on-Fe and Fe-on-Si interfaces, whereas an asymmetry is revealed in the composition of the ferromagnetic silicide sublayer. (C) 2015 Elsevier B.V. All rights reserved.

引用

页码：271 / 275

页数：5

共 43 条

[1] Morphology of the asymmetric iron-silicon interfaces [J].

Badia-Romano, L. ;

Rubin, J. ;

Bartolome, F. ;

Magen, C. ;

Bartolome, J. ;

Varnakov, S. N. ;

Ovchinnikov, S. G. ;

Rubio-Zuazo, J. ;

Castro, G. R. .

JOURNAL OF ALLOYS AND COMPOUNDS, 2015, 627 :136-145

[2] MORPHOLOGICAL AND COMPOSITIONAL STUDY AT THE Si/Fe INTERFACE OF (Fe/Si) MULTILAYER [J].

Badia-Romano, L. ;

Rubin, J. ;

Bartolome, F. ;

Bartolome, J. ;

Ovchinnikov, S. ;

Varnakov, S. ;

Magen, C. ;

Rubio-Zuazo, J. ;

Castro, G. R. .

SPIN, 2014, 4 (01)

[3] Iron silicide formation at different layers of (Fe/Si)3 multilayered structures determined by conversion electron Mossbauer spectroscopy [J].

Badia-Romano, L. ;

Rubin, J. ;

Magen, C. ;

Buergler, D. E. ;

Bartolome, J. .

JOURNAL OF APPLIED PHYSICS, 2014, 116 (02)

[4] GIANT MAGNETORESISTANCE OF (001)FE/(001) CR MAGNETIC SUPERLATTICES [J].

BAIBICH, MN ;

BROTO, JM ;

FERT, A ;

VANDAU, FN ;

PETROFF, F ;

EITENNE, P ;

CREUZET, G ;

FRIEDERICH, A ;

CHAZELAS, J .

PHYSICAL REVIEW LETTERS, 1988, 61 (21) :2472-2475

[5] NOVEL MAGNETORESISTANCE EFFECT IN LAYERED MAGNETIC-STRUCTURES - THEORY AND EXPERIMENT [J].

BARNAS, J ;

FUSS, A ;

CAMLEY, RE ;

GRUNBERG, P ;

ZINN, W .

PHYSICAL REVIEW B, 1990, 42 (13) :8110-8120

[6] ENHANCED MAGNETORESISTANCE IN LAYERED MAGNETIC-STRUCTURES WITH ANTIFERROMAGNETIC INTERLAYER EXCHANGE [J].

BINASCH, G ;

GRUNBERG, P ;

SAURENBACH, F ;

ZINN, W .

PHYSICAL REVIEW B, 1989, 39 (07) :4828-4830

[7] Ag films on Fe/GaAs(001): From clean surfaces to atomic Ga structures [J].

Burgler, DE ;

Schmidt, CM ;

Wolf, JA ;

Schaub, TM ;

Guntherodt, HJ .

SURFACE SCIENCE, 1996, 366 (02) :295-305

[8] Structure and magnetism of Fe/Si multilayers grown by ion-beam sputtering [J].

Chaiken, A ;

Michel, RP ;

Wall, MA .

PHYSICAL REVIEW B, 1996, 53 (09) :5518-5529

[9] FORMATION OF THE FE-STEPPED SI(100) INTERFACE AS STUDIED BY ELECTRON-SPECTROSCOPY [J].

CHERIEF, N ;

VEUILLEN, JY ;

TAN, TAN ;

CINTI, R ;

DERRIEN, J .

VACUUM, 1990, 41 (4-6) :1350-1352

[10] DIRECT OBSERVATION OF SILICIDE GROWTH AT FE-SI INTERFACE DURING PULSED-LASER DEPOSITION [J].

CHUBUNOVA, EV ;

KHABELASHVILI, ID ;

LEBEDINSKII, YY ;

NEVOLIN, VN ;

ZENKEVICH, A .

THIN SOLID FILMS, 1994, 247 (01) :39-43

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