Mapping of a particular element using an absorption edge with an X-ray fluorescence imaging microscope

被引：12

作者：

Yamamoto, K ^{[1
]}

Watanabe, N ^{[1
]}

Takeuchi, A ^{[1
]}

Takano, H ^{[1
]}

Aota, T ^{[1
]}

Fukuda, M ^{[1
]}

Aoki, S ^{[1
]}

机构：

[1] Univ Tsukuba, Inst Appl Phys, Tsukuba, Ibaraki 3058573, Japan

来源：

JOURNAL OF SYNCHROTRON RADIATION | 2000年 / 7卷 / 01期

关键词：

imaging; X-ray fluorescence; microscopes; Wolter-type mirrors;

D O I：

10.1107/S0909049599014260

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

An X-ray fluorescence imaging microscope with a Welter-type objective mirror (magnification: 13) has been constructed at beamline 39XU of SPring-8. Monochromatic X-rays (Delta E/E similar or equal to 10(-4)) in the energy range 6-10 keV were used for X-ray fluorescence excitation of the specimens. Using two monochromatic X-rays above and below the absorption edge of a particular element, a two-dimensional image of the element could be obtained. As a result, two-dimensional element mapping of the test specimens (Cu, Co, Ni, Fe and Ti wires) and constituent minerals (Fe, Mn and Ti) of a rock specimen (a piemontite-quartz schist) became possible.

引用

页码：34 / 39

页数：6

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