Reconfigurable architecture for autonomous self-repair

被引：69

作者：

Mitra, S ^{[1
]}

Huang, WJ ^{[1
]}

Saxena, NR ^{[1
]}

Yu, SY ^{[1
]}

McCluskey, EJ ^{[1
]}

机构：

[1] Stanford Univ, Ctr Reliabil Comp, Stanford, CA 94305 USA

来源：

IEEE DESIGN & TEST OF COMPUTERS | 2004年 / 21卷 / 03期

关键词：

D O I：

10.1109/MDT.2004.18

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Fault-tolerant systems typically require expensive additional resources (spare pins, columns, and chips) and external control for reconfiguration. This article introduces an effective, low-cost repair solution in which originally unused blocks and routing resources replace faulty parts. In addition, the proposed reconfiguration hardware allows autonomous repair, that is, the system does not require external intervention for recovery.

引用

页码：228 / 240

页数：13

共 26 条

[11] Transient errors and rollback recovery in LZ compression [J].

Huang, WJ ;

McCluskey, EJ .

2000 PACIFIC RIM INTERNATIONAL SYMPOSIUM ON DEPENDABLE COMPUTING, PROCEEDINGS, 2000, :128-135

[12]

HUANG WJ, 2001, P IEEE FIELD PROGR C

[13]

HUANG WJ, 2001, P ACM SIGDA INT S FI, P183

[14]

Kraft G, 1981, MICROPROGRAMMED CONT

[15]

Lach J., 1999, Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99), P386, DOI 10.1109/DFTVS.1999.802906

[16]

LACH J, 1998, P ACM SIGDA 6 INT S, P105

[17]

MCCLUSKEY EJ, 1981, IEEE T COMPUT, V30, P866, DOI 10.1109/TC.1981.1675717

[18] A design diversity metric and analysis of redundant systems [J].

Mitra, S ;

Saxena, NR ;

McCluskey, EJ .

IEEE TRANSACTIONS ON COMPUTERS, 2002, 51 (05) :498-510

[19]

Ohring M., 1998, Reliability and Failure of Electronic Material and Devices

[20] Dependable computing and online testing in adaptive and configurable systems [J].

Saxena, NR ;

Fernandez-Gomez, S ;

Huang, WJ ;

Mitra, S ;

Yu, SY ;

McCluskey, EJ .

IEEE DESIGN & TEST OF COMPUTERS, 2000, 17 (01) :29-41

← 1 2 3 →