共 50 条
- [44] Mechatronic Demodulation for Dynamic Atomic Force Microscopy Measurement Modes 2022 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC 2022), 2022,
- [50] A Review on: Atomic Force Microscopy Applied to Nano-mechanics of the Cell NANO/MICRO BIOTECHNOLOGY, 2010, 119 : 47 - 61