Simultaneous atomic force microscope and fluorescence measurements of protein unfolding using a calibrated evanescent wave

被引:98
|
作者
Sarkar, A
Robertson, RB
Fernandez, JM [1 ]
机构
[1] Columbia Univ, Dept Biol Sci, New York, NY 10025 USA
[2] Mayo Clin & Mayo Fdn, Coll Med, Dept Neurol Surg, Rochester, MN 55905 USA
关键词
D O I
10.1073/pnas.0403534101
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Fluorescence techniques for monitoring single-molecule dynamics in the vertical dimension currently do not exist. Here we use an atomic force microscope to calibrate the distance-dependent intensity decay of an evanescent wave. The measured evanescent wave transfer function was then used to convert the vertical motions of a fluorescent particle into displacement (SD = <1 nm). We demonstrate the use of the calibrated evanescent wave to resolve the 20.1 +/- 0.5-nm step increases in the length of the small protein ubiquitin during forced unfolding. The experiments that we report here make an important contribution to fluorescence microscopy by demonstrating the unambiguous optical tracking of a single molecule with a resolution comparable to that of an atomic force microscope.
引用
收藏
页码:12882 / 12886
页数:5
相关论文
共 50 条
  • [1] Application of evanescent wave optics to the determination of absolute distance in surface force measurements using the atomic force microscope
    Huntington, ST
    Hartley, PG
    Katsifolis, J
    ULTRAMICROSCOPY, 2003, 94 (3-4) : 283 - 291
  • [2] Improving step height and pitch measurements using the calibrated atomic force microscope
    Koning, R
    Dixson, R
    Fu, J
    Tsai, VW
    Renegar, TB
    Vorburger, T
    PROCEEDINGS OF THE FIRST INTERNATIONAL SYMPOSIUM ON INSTRUMENTATION SCIENCE AND TECHNOLOGY, 1999, : 548 - 555
  • [3] A calibrated atomic force microscope using an orthogonal scanner and a calibrated laser interferometer
    Lee, Dong-Yeon
    Kim, Dong-Min
    Gweon, Dae-Gab
    Park, Jinwon
    APPLIED SURFACE SCIENCE, 2007, 253 (08) : 3945 - 3951
  • [4] Investigation of protein adsorption with simultaneous measurements of atomic force microscope and quartz crystal microbalance
    Choi, KH
    Friedt, JM
    Laureyn, W
    Frederix, F
    Campitelli, A
    Borghs, G
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2003, 21 (04): : 1433 - 1436
  • [5] Measurements of pitch, height, and width artifacts with the NIST calibrated atomic force microscope
    Dixson, R
    Tsai, VW
    Vorburger, T
    Williams, ED
    Wang, XS
    Fu, J
    Koning, R
    PROCEEDINGS OF: ADVANCES IN SURFACE METROLOGY, 1997, : 70 - 75
  • [6] Measurement of the evanescent field using noncontact mode atomic force microscope
    Abe, M
    Uchihashi, T
    Ohta, M
    Ueyama, H
    Sugawara, Y
    Morita, S
    OPTICAL REVIEW, 1997, 4 (1B) : 232 - 235
  • [7] Measurement of the evanescent field using noncontact mode atomic force microscope
    Abe M.
    Uchihashi T.
    Ohta M.
    Ueyama H.
    Sugawara Y.
    Morita S.
    Optical Review, 1997, 4 (1) : A232 - A235
  • [8] Measurement of the evanescent field using noncontact mode atomic force microscope
    Masayuki Abe
    Takayuki Uchihashi
    Masahiro Ohta
    Hitoshi Ueyama
    Yasuhiro Sugawara
    Seizo Morita
    Optical Review, 1997, 4 : 232 - 235
  • [9] Precision measurements of the Casimir force using an atomic force microscope
    Harris, BW
    Chen, F
    Roy, A
    Mohideen, U
    QUANTUM ELECTRODYNAMICS AND PHYSICS OF THE VACUUM, 2001, 564 : 21 - 27
  • [10] SIMULTANEOUS MEASUREMENTS OF FRICTION AND TOPOGRAPHY ON ORGANIC FILMS WITH THE ATOMIC FORCE MICROSCOPE
    OVERNEY, RM
    MEYER, E
    HOWALD, L
    LUTHI, R
    FROMMER, JE
    GUNTHERODT, HJ
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1992, 203 : 330 - COLL