Optoelectronic system for gain measurements in low-pressure gas lasers

The device described is designed to measure the gain in a cw HF chemical laser with the intensified luminescence technique. This is achieved by recording the luminescence spectrum and intensity as a result of a single and double passage of radiation through the active medium under analysis. The gains at the resonance frequencies for separate lines of HF laser radiation are determined computationally to an accuracy of 15-20%, taking into account measured ratios of the luminescence fluxes, the active medium length, and the effective reflectance of the returning mirror by using an approximating relation that takes into consideration the spectrum line profile.