Photosensitivity of ion-exchanged Er-doped phosphate glass using 248nm excimer laser radiation

被引:40
作者
Pissadakis, S
Ikiades, A
Hua, P
Sheridan, AK
Wilkinson, JS
机构
[1] Fdn Res & Technol Hellas, Inst Elect Struct & Laser, Iraklion 71110, Greece
[2] Univ Southampton, Optoelect Res Ctr, Southampton SO17 1BJ, Hants, England
关键词
D O I
10.1364/OPEX.12.003131
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The photosensitivity to 248nm excimer laser radiation of Er-doped Schott IOG-1 phosphate glass is presented. The photosensitive mechanism is investigated by employing a grating recording process. Index changes of up to similar to 2.0 x 10(-3) were measured in silver ion-exchanged samples using diffraction efficiency measurements; whereas changes of only similar to 10(-5) were measured for non-ion-exchanged samples. Absorption measurements allowed the identification of specific color center bands, which were attributed to the glass matrix and to the silver ions. Investigation of the exposed ion-exchanged glass using scanning electron microscopy and energy dispersive x-ray microanalysis revealed that in addition to the color centers formed, silver ion migration and ionization contribute significantly to the UV-induced index changes. (C) 2004 Optical Society of America.
引用
收藏
页码:3131 / 3136
页数:6
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