Correlation between RF Signal Reflection on Electrodes and Modulation Variation of Silicon Mach-Zehnder Modulators

被引：0
|
作者：
Zeng, Zhaobang [1 ,2 ,3 ]
Zhao, Peiyan [1 ,2 ,3 ]
Yang, Nan [1 ,2 ,3 ]
Gao, Qianyi [1 ,2 ,3 ]
Tang, Bo [4 ]
Li, Zhihua [4 ]
Yan, Jiang [5 ]
Jiang, Wei [1 ,2 ,3 ]
机构：
[1] Nanjing Univ, Coll Engn & Appl Sci, Nanjing 210093, Peoples R China
[2] Nanjing Univ, Minist Educ, Key Lab Intelligent Opt Sensing & Manipulat, Nanjing 210093, Peoples R China
[3] Natl Lab Solid State Microstruct, Nanjing 210093, Peoples R China
[4] Chinese Acad Sci, Inst Microelect, Beijing, Peoples R China
[5] North China Univ Technol, Beijing, Peoples R China
来源：
2020 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) | 2020年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We introduce (partial) correlation coefficients to explore the relation between the driving signal reflection on traveling wave electrodes and the performance variation of silicon MachZehnder modulators. Relevant fabrication variation scenarios and potential remedies are discussed. (C) 2020 The Author(s)
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页数：2
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