Photonic Bloch Oscillations and Zener Tunneling in Dual-Periodical Multilayers Made of Porous Silicon: Effect of Angle of Incidence

被引:1
作者
Estevez, J. O. [1 ]
Arriaga, J. [1 ]
Reyes-Ayona, E. [1 ]
Agarwal, V. [2 ]
机构
[1] Univ Autonoma Puebla, Inst Fis, Puebla 72570, Mexico
[2] UAEM, Ctr Invest Ingn & Ciencias Aplicadas, Cuernavaca 62210, Morelos, Mexico
关键词
Zener tunneling; Photonic Crystals; Porous Silicon; Physical thickness gradient; MODES;
D O I
10.4028/www.scientific.net/JNanoR.28.83
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Experimental evidence of photon Bloch Oscillations (PBOs) and Zener tunneling (ZT) in dual-periodical (DP) superlattices made of porous silicon (PSi), is presented. An introduction of linear gradient in physical layer thicknesses in DP structure, composed by stacking two different periodic substructures N times, where (N-1) resonances appear, i.e, WSLs resonances and Zener tunneling of the nearest resonances of two consecutive minibands can be observed depending on the values of applied gradient. Theoretical time-resolved reflection and scattering state maps show photonic Bloch oscillations (BOs) and Zener tunneling for a range of incidence angles. Measured reflection reveals the presence of Wannier-Stark ladders (WSLs) and ZT in the near infrared region.
引用
收藏
页码:83 / 90
页数:8
相关论文
共 3 条
  • [1] Demonstration of photon Bloch oscillations and Wannier-Stark ladders in dual-periodical multilayer structures based on porous silicon
    Octavio Estevez, J.
    Arriaga, Jesus
    Mendez-Blas, Antonio
    Reyes-Ayona, Edgar
    Escorcia, Jose
    Agarwal, Vivechana
    NANOSCALE RESEARCH LETTERS, 2012, 7
  • [2] Demonstration of photon Bloch oscillations and Wannier-Stark ladders in dual-periodical multilayer structures based on porous silicon
    J Octavio Estevez
    Jesús Arriaga
    Antonio Mendez-Blas
    Edgar Reyes-Ayona
    José Escorcia
    Vivechana Agarwal
    Nanoscale Research Letters, 7
  • [3] Chirped dual periodic structures for photonic Bloch oscillations and Zener tunneling
    Estevez, J. O.
    Arriaga, J.
    Reyes-Ayona, E.
    Agarwal, V.
    OPTICS EXPRESS, 2015, 23 (13): : 16500 - 16510