Corrected direct force balance method for atomic force microscopy lateral force calibration

被引：15

作者：

Asay, David B. ^{[1
]}

Hsiao, Erik ^{[1
]}

Kim, Seong H. ^{[1
]}

机构：

[1] Penn State Univ, Dept Chem Engn, University Pk, PA 16802 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2009年 / 80卷 / 06期

基金：

美国国家科学基金会;

关键词：

atomic force microscopy; calibration; CANTILEVERS; NANOFRICTION; FRICTION;

D O I：

10.1063/1.3142243

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

This paper reports corrections and improvements of the previously reported direct force balance method (DFBM) developed for lateral calibration of atomic force microscopy. The DFBM method employs the lateral force signal obtained during a force-distance measurement on a sloped surface and relates this signal to the applied load and the slope of the surface to determine the lateral calibration factor. In the original publication [Rev. Sci. Instrum. 77, 043903 (2006)], the tip-substrate contact was assumed to be pinned at the point of contact, i.e., no slip along the slope. In control experiments, the tip was found to slide along the slope during force-distance curve measurement. This paper presents the correct force balance for lateral force calibration.

引用

页数：3

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