About Reliability of Circuits with Faults of Type 0 at the Outputs of Elements in a Full Finite Basis Containing a Special Function

被引：2

作者：

Alekhina, M. A. ^{[1
]}

Gusynina, Yu. S. ^{[1
]}

Shornikova, T. A. ^{[1
]}

机构：

[1] Penza State Technol Univ, 1a-1 Baidukova Pas-Gagarina Str, Penza 440039, Russia

来源：

RUSSIAN MATHEMATICS | 2019年 / 63卷 / 06期

基金：

俄罗斯基础研究基金会;

关键词：

unreliable functional gates; reliability and unreliability of circuit; synthesis of circuits composed of unreliable gates; UNRELIABILITY;

D O I：

10.3103/S1066369X19060094

中图分类号：

O1 [数学];

学科分类号：

0701 ; 070101 ;

摘要：

We consider a realization of Boolean functions by the circuits from unreliable elements in a full basis B, containing a special function. We assume that all elements of a circuit are exposed to the faults type 0 at the outputs with probability epsilon is an element of (0, 1/2) independently of each other. We prove that almost any Boolean function can be implemented by an asymptotically optimal in reliability circuit functioning with the unreliability which is asymptotically equal to epsilon with epsilon -> 0.

引用

页码：79 / 81

页数：3

共 6 条

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Alekhina M.A. ;

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Shornikova T.A. .

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[2] On Bases with Unreliability Coefficient 2 [J].

Alekhina, M. A. ;

Vasin, A. V. .

MATHEMATICAL NOTES, 2014, 95 (1-2) :147-173

[3]

Alekhina MA, 2010, P INT S REL QUAL 201, V1, P229

[4]

Alekhina MA, 2006, SYNTHESIS RELIABILIT

[5]

Redkin N. P., 1989, MAT VOPR KIBERN, P198

[6]

Yablonskii S. V., 2001, INTRO DISCRETE MATH

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