Defect-Induced Enhancement and Quenching Control of Photocurrent in Few-Layer Graphene Photodetectors

被引：27

作者：

Gowda, Prarthana ^{[1
]}

Sakorikar, Tushar ^{[1
]}

Reddy, Siva K. ^{[1
]}

Ferry, Darim B. ^{[1
]}

Misra, Abha ^{[1
]}

机构：

[1] Indian Inst Sci, Dept Instrumentat & Appl Phys, Bangalore 560012, Karnataka, India

来源：

ACS APPLIED MATERIALS & INTERFACES | 2014年 / 6卷 / 10期

关键词：

graphene; multiwalled carbon nanotubes; wrinkled graphene; photodetector; photocurrent; PLASMONICS; TRANSPORT;

D O I：

10.1021/am500865f

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

A novel approach is presented for achieving an enhanced photo-response in a few layer graphene (FLG) based photodetector that is realized by introducing defect sites in the FLG. Fabrication induced wrinkle formation in graphene presented a four-fold enhancement in the photocurrent when compared to unfold PLC. Interestingly, it was observed that the addition of few multiwalled carbon nanotubes to an FLG improves the photocurrent by two-fold along with a highly stable response as compared to FLG alone.

引用

页码：7485 / 7490

页数：6

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