On high resolution, pulse-profiled mm-wave intermodulation measurements

被引：0
作者：
Martens, J. [1 ]
机构：
[1] Anritsu Co, Morgan Hill, CA 95037 USA
来源：
2013 8TH EUROPEAN MICROWAVE INTEGRATED CIRCUITS CONFERENCE (EUMIC) | 2013年
关键词：
mm-wave; network analyzer; pulse profile; intermodulation distortion; nonlinearity;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Distortion measurements in mm-wave systems are becoming increasingly important including in situations with pulsed or related signals. Of particular interest are edge-related phenomena including nonlinearities induced by drive overshoot and ringing and those whose behaviors are convolved with longer time constant mechanisms (e. g., thermal). Complications, calibration methods, potential uncertainties, and resolution-offset tradeoffs associated with this measurement class will be discussed in the context of W-band and D-band amplifier measurements emphasizing edge-related IMD behavior.
引用
收藏
页码：392 / 395
页数：4
相关论文
共 13 条
  • [1] Ahmed S, 2011, IEEE ICC
  • [2] Albahrani SA, 2010, ASIA PACIF MICROWAVE, P398
  • [3] De Groote F., 2009, 73 ARFTG C DEC, P1
  • [4] Faraj Jad, 2008, 2008 38th European Microwave Conference (EuMC), P757, DOI 10.1109/EUMC.2008.4751563
  • [5] Faraj J., 2009, 73 ARFTG C DEC, P1
  • [6] Identification of RF power amplifier memory effect origins using third-order intermodulation distortion amplitude and phase asymmetry
    Kenney, J. Stevenson
    Fedorenko, Pavlo
    [J]. 2006 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-5, 2006, : 1121 - +
  • [7] Martens J., 2005, 65 ARFTG CONF JUN
  • [8] Martens J., 2012, 2012 EUR MIC C P NOV
  • [9] Martinez-Vargas JD, 2012, IEEE ENG MED BIO, P1, DOI [10.1155/2012/951213, 10.1109/EMBC.2012.6345856]
  • [10] Multitone phase and.amplitude measurement for nonlinear device characterization
    Martins, JP
    Carvalho, NB
    [J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2005, 53 (06) : 1982 - 1989
12