On high resolution, pulse-profiled mm-wave intermodulation measurements

被引：0

作者：

Martens, J. ^{[1
]}

机构：

[1] Anritsu Co, Morgan Hill, CA 95037 USA

来源：

2013 8TH EUROPEAN MICROWAVE INTEGRATED CIRCUITS CONFERENCE (EUMIC) | 2013年

关键词：

mm-wave; network analyzer; pulse profile; intermodulation distortion; nonlinearity;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Distortion measurements in mm-wave systems are becoming increasingly important including in situations with pulsed or related signals. Of particular interest are edge-related phenomena including nonlinearities induced by drive overshoot and ringing and those whose behaviors are convolved with longer time constant mechanisms (e. g., thermal). Complications, calibration methods, potential uncertainties, and resolution-offset tradeoffs associated with this measurement class will be discussed in the context of W-band and D-band amplifier measurements emphasizing edge-related IMD behavior.

引用

页码：392 / 395

页数：4

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