Electron impact ionization cross-sections of SF3 and SF5

被引:5
作者
Huo, WM
Tarnovsky, V
Becker, K
机构
[1] NASA, Ames Res Ctr, Moffett Field, CA 94035 USA
[2] Stevens Inst Technol, Ctr Environm Syst, Hoboken, NJ 07030 USA
[3] Stevens Inst Technol, Dept Phys & Engn Phys, Hoboken, NJ 07030 USA
关键词
electron ionization; cross-sections; free radicals; plasma processing;
D O I
10.1016/j.ijms.2003.12.011
中图分类号
O64 [物理化学(理论化学)、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号
070203 ; 070304 ; 081704 ; 1406 ;
摘要
We report experimental and theoretical studies of the total electron impact ionization cross-sections for the radicals SF3 and SF5. It is shown that for radicals with strongly polar fluoride bonds, the shielding of the attractive dipole interaction potential in the bonding region is important in a proper description of the collision process. The siBED model, which has incorporated the shielding factor, was found to provide cross-sections in agreement with recently re-analyzed experimental data for the species CFx, and NFx (x = 1-3), whereas the DM model and the BEB model, on the other hand, showed large discrepancies with experiment. These findings also hold for the two free radicals SF3 and SF5 studied here, providing further evidence on the importance of a proper shielding of the dipole potential. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:111 / 116
页数:6
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