Formation of Si clusters and their role in homoepitaxial growth on Si(111)-7 x 7 surfaces

被引:21
作者
Ho, MS
Hwang, IS
Tsong, TT
机构
[1] Natl Chung Hsing Univ, Ctr Nanosci & Nanotechnol, Dept Phys, Taichung 402, Taiwan
[2] Acad Sinica, Inst Phys, Taipei 115, Taiwan
关键词
scanning tunneling microscopy; silicon; clusters; nucleation; epitaxy; growth;
D O I
10.1016/j.susc.2004.05.137
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
With scanning tunneling microscopy (STM), we observe the dynamic behavior of Si atoms on Si(111)-7 x 7 surfaces. At temperatures below similar to200 degreesC, Si atoms are found to aggregate into small clusters that show interesting structures on surfaces. When the substrate temperature is raised above 200 degreesC, only a new type of Si magic clusters is discovered. These clusters dictate many dynamic phenomena on Si(111) surfaces, including mass transport, step fluctuations, epitaxial growth, and the decay of non-equilibrium structures. At temperatures above similar to400 degreesC, the magic clusters become mobile. Most of the clusters are confined within the half-cells, but some of them move out of the half-cells and re-appear at a distance of about a few hundred angstroms (Angstrom) away. Using Arrhenius analysis, the activation energies and pre-exponential factors for different moving pathways are derived. The jump-length distribution exhibits two maxima; one at the origin and another at similar to500 Angstrom away. The growth of islands can occur either at the step edges or by a concerted reaction at the terraces as the cluster density fluctuates to reach a threshold value. (C) 2004 Published by Elsevier B.V.
引用
收藏
页码:93 / 107
页数:15
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