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A membrane probe for testing high power amplifiers at mm-wave frequencies
被引：0
作者：
Basu, S
Nussbaumer, P
Strid, E
机构：
来源：
27TH EUROPEAN MICROWAVE 97, CONFERENCE + EXHIBITION - BRIDGING THE GAP BETWEEN INDUSTRY AND ACADEMIA, VOLS I AND II
|
1997年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术];
TN [电子技术、通信技术];
学科分类号：
0808 ;
0809 ;
摘要：
Traditional coaxial-needle probe cards have difficulty in incorporating combiner structures and generally have poor bypassing capability at high frequencies. In this paper, we will demonstrate how membrane probes can incorporate these features with minimal parasitic effects and conduct accurate and fast testing of power amplifiers at Ka-band.
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页码：481 / 484
页数：4
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