Reduced Probability of Noise Introduced Malfunction in RSFQ Circuits by Implementing Intrinsic π-Phaseshifter

被引：8

作者：

Mielke, O. ^{[1
]}

Ortlepp, T. ^{[1
]}

Febvre, P. ^{[2
]}

Uhlmann, F. H. ^{[1
]}

机构：

[1] Tech Univ Ilmenau, RSFQ Design Grp, Inst Informat Technol, D-98684 Ilmenau, Germany

[2] Univ Savoie, Microwave & Characterizat Lab, IMEP LAHC CNRS, UMR 5130, F-73376 Le Bourget Du Lac, France

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 2009年 / 19卷 / 03期

关键词：

Bit-error rate (BER); circuit design; RSFQ; thermal noise; pi-phaseshifter; FLUX QUANTUM LOGIC; PHASE;

D O I：

10.1109/TASC.2009.2018145

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The Rapid Single Flux Quantum electronics is characterized by a low switching energy, which makes it susceptible to noise introduced bit-errors. For industrial applications a certain noise immunity is required which is still a challenge especially for circuits of higher complexity. We analysed the influence of each individual resistor in a toggle Flip-Flop circuit to the overall bit-error rate. The shunt resistors of comparator structures are the dominant noise sources and bias resistors have almost no influence. Our theoretical analysis shows a significant impact of the phase offset caused by a pi-phaseshifter, which increases the robustness of RSFQ electronics even for circuits fabricated in mature Nb-technology. We experimentally investigated the influence of the pi-phaseshifter on the bit-error rate. We designed dedicated test circuits with and without a phaseshifter. There are only slight differences in the layout of both cells, thus it can be concluded that this advantage is based only on the influence of the phaseshifter. Our presented experiments show significant variances in the bit-error rate confirming the improved immunity against noise. Design and fabrication were performed by FLUXONICS Foundry.

引用

页码：621 / 625

页数：5

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