Single-event effects in resolver-to-digital converters

Single-event effects (SEE's) in two resolver-to-digital converters (RDC's) have been studied using heavy ions and pulsed laser light. The important role of the pulsed laser in establishing single-event upset (SEU) and single-event latchup (SEL) levels prior to accelerator testing is described, as is its role in evaluating the test software and hardware and in gaining a better understanding of the origins of the SEE's. Results from pulsed-laser testing are in quantitative agreement with those from heavy-ion testing: the RDC-19220 is sensitive to both SEU's and SEL's whereas the AD2S80 is less sensitive to SEU's and immune to SEL.