Improved Bandwidth and Noise Resilience in Thermal Impedance Spectroscopy by Mixing PRBS Signals

被引:15
作者
Davidson, Jonathan N. [1 ]
Stone, David A. [1 ]
Foster, Martin P. [1 ]
Gladwin, Daniel T. [1 ]
机构
[1] Univ Sheffield, Dept Elect & Elect Engn, Sheffield S1 3JD, S Yorkshire, England
关键词
Noise; pseudonoise coding; pseudonoise processes; spectroscopy; thermal variables measurement; POWER; IDENTIFICATION;
D O I
10.1109/TPEL.2013.2288936
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a method of mixing pseudo-random binary sequences (PRBSs) to form a new signal that can be used to obtain the thermal impedance spectrum of power electronic systems. The proposed technique increases the useful frequency range of a PRBS by mixing two identical sequences at different frequencies. The new signal incorporates the frequency responses of both contributions. Mixing can be performed using a number of mathematical operators and analysis reveals that AND is the operator of choice since it has the lowest average input power for the same effectiveness. The bandwidth, frequency-domain representation, and noise resilience of PRBS signals are also reported. It is shown that the noise floor is significantly reduced under the mixed technique, which allows lower impedances to be measured under noisy measurement conditions. For a typical 8-bit PRBS, mixing reduces the noise floor by a factor of 10.5. Simulated and experimental validation are performed and results show the mixed scheme offers increased bandwidth, reduced computation and improved noise resilience compared to single PRBS techniques.
引用
收藏
页码:4817 / 4828
页数:12
相关论文
共 29 条
[1]  
Albers S. C., 1992, U.S. Patent, Patent No. [5 153, 5153]
[2]  
Biela J, 2007, 2007 POWER CONVERSION CONFERENCE - NAGOYA, VOLS 1-3, P1
[3]   A Fast Loss and Temperature Simulation Method for Power Converters, Part I: Electrothermal Modeling and Validation [J].
Bryant, Angus ;
Parker-Allotey, Nii-Adotei ;
Hamilton, Dean ;
Swan, Ian ;
Mawby, Philip A. ;
Ueta, Takashi ;
Nishijima, Toshifumi ;
Hamada, Kimimori .
IEEE TRANSACTIONS ON POWER ELECTRONICS, 2012, 27 (01) :248-257
[4]   Exploration of power device reliability using compact device models and fast electrothermal simulation [J].
Bryant, Angus T. ;
Mawby, Philip A. ;
Palmer, Patrick R. ;
Santi, Enrico ;
Hudgins, Jerry L. .
IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS, 2008, 44 (03) :894-903
[5]  
Davidson Jonathan, 2013, International Conference and Exhibition for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management. Proceedings, P1047
[6]   Arbitrary waveform power controller for thermal measurements of semiconductor devices [J].
Davidson, J. N. ;
Stone, D. A. ;
Foster, M. P. .
ELECTRONICS LETTERS, 2012, 48 (07) :400-U141
[7]  
DAVIES WDT, 1970, SYSTEM IDENTIFICATIO, P44
[8]   Automated Fast Extraction of Compact Thermal Models for Power Electronic Modules [J].
Evans, Paul L. ;
Castellazzi, Alberto ;
Johnson, C. Mark .
IEEE TRANSACTIONS ON POWER ELECTRONICS, 2013, 28 (10) :4791-4802
[9]   Modelling of VRLA batteries over operational temperature range using Pseudo Random Binary Sequences [J].
Fairweather, A. J. ;
Foster, M. P. ;
Stone, D. A. .
JOURNAL OF POWER SOURCES, 2012, 207 :56-59
[10]   Identification of a thermal system using continuous linear parameter-varying fractional modelling [J].
Gabano, J. -D. ;
Poinot, T. ;
Kanoun, H. .
IET CONTROL THEORY AND APPLICATIONS, 2011, 5 (07) :889-899