共 42 条
High-Performance Low-Cost Back-Channel-Etch Amorphous Gallium-Indium-Zinc Oxide Thin-Film Transistors by Curing and Passivation of the Damaged Back Channel
被引:34
作者:

Park, Jae Chul
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机构:
Yonsei Univ, Inst Phys & Appl Phys, Seoul 120749, South Korea Yonsei Univ, Inst Phys & Appl Phys, Seoul 120749, South Korea

Ahn, Seung-Eon
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Samsung Adv Inst Technol, Semicond Device Lab, Yongin 446712, South Korea Yonsei Univ, Inst Phys & Appl Phys, Seoul 120749, South Korea

Lee, Ho-Nyeon
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Soonchunhyang Univ, Dept Display & Elect Informat Engn, Asan 336745, South Korea Yonsei Univ, Inst Phys & Appl Phys, Seoul 120749, South Korea
机构:
[1] Yonsei Univ, Inst Phys & Appl Phys, Seoul 120749, South Korea
[2] Samsung Adv Inst Technol, Semicond Device Lab, Yongin 446712, South Korea
[3] Soonchunhyang Univ, Dept Display & Elect Informat Engn, Asan 336745, South Korea
关键词:
annealing;
back-channel etch;
field-effect transistor;
gallium-indium-zinc oxide;
N2O plasma;
passivation;
SEMICONDUCTOR;
INSTABILITIES;
PRESSURE;
MOBILITY;
STOPPER;
STRESS;
METAL;
D O I:
10.1021/am404490t
中图分类号:
TB3 [工程材料学];
学科分类号:
0805 ;
080502 ;
摘要:
High-performance, low-cost amorphous gallium indium-zinc-oxide (a-GIZO) thin-film-transistor (TFT) technology is required for the next generation of active-matrix organic light-emitting diodes. A back-channel-etch structure is the most appropriate device structure for high-performance, low-cost a-GIZO TFT technology. However, channel damage due to source/drain etching and passivation-layer deposition has been a critical issue. To solve this problem, the present work focuses on overall back-channel processes, such as back-channel N2O plasma treatment, SiOx passivation deposition, and final thermal annealing. This work has revealed the dependence of a-GIZO TFT characteristics on the N2O plasma radio-frequency (RF) power and frequency, the SiH4 flow rate in the SiOx deposition process, and the final annealing temperature. On the basis of these results, a high-performance a-GIZO TFT with a field-effect mobility of 35.7 cm(2) V-1 s(-1), a subthreshold swing of 185 mV dec(-1), a switching ratio exceeding 10(7), and a satisfactory reliability was successfully fabricated. The technology developed in this work can be realized using the existing facilities of active-matrix liquid-crystal display industries.
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页码:12262 / 12267
页数:6
相关论文
共 42 条
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