High-Performance Low-Cost Back-Channel-Etch Amorphous Gallium-Indium-Zinc Oxide Thin-Film Transistors by Curing and Passivation of the Damaged Back Channel

被引:34
作者
Park, Jae Chul [1 ]
Ahn, Seung-Eon [2 ]
Lee, Ho-Nyeon [3 ]
机构
[1] Yonsei Univ, Inst Phys & Appl Phys, Seoul 120749, South Korea
[2] Samsung Adv Inst Technol, Semicond Device Lab, Yongin 446712, South Korea
[3] Soonchunhyang Univ, Dept Display & Elect Informat Engn, Asan 336745, South Korea
关键词
annealing; back-channel etch; field-effect transistor; gallium-indium-zinc oxide; N2O plasma; passivation; SEMICONDUCTOR; INSTABILITIES; PRESSURE; MOBILITY; STOPPER; STRESS; METAL;
D O I
10.1021/am404490t
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
High-performance, low-cost amorphous gallium indium-zinc-oxide (a-GIZO) thin-film-transistor (TFT) technology is required for the next generation of active-matrix organic light-emitting diodes. A back-channel-etch structure is the most appropriate device structure for high-performance, low-cost a-GIZO TFT technology. However, channel damage due to source/drain etching and passivation-layer deposition has been a critical issue. To solve this problem, the present work focuses on overall back-channel processes, such as back-channel N2O plasma treatment, SiOx passivation deposition, and final thermal annealing. This work has revealed the dependence of a-GIZO TFT characteristics on the N2O plasma radio-frequency (RF) power and frequency, the SiH4 flow rate in the SiOx deposition process, and the final annealing temperature. On the basis of these results, a high-performance a-GIZO TFT with a field-effect mobility of 35.7 cm(2) V-1 s(-1), a subthreshold swing of 185 mV dec(-1), a switching ratio exceeding 10(7), and a satisfactory reliability was successfully fabricated. The technology developed in this work can be realized using the existing facilities of active-matrix liquid-crystal display industries.
引用
收藏
页码:12262 / 12267
页数:6
相关论文
共 42 条
[1]   Effect of the Electrode Materials on the Drain-Bias Stress Instabilities of In-Ga-Zn-O Thin-Film Transistors [J].
Bak, Jun Yong ;
Yang, Sinhyuk ;
Ryu, Min Ki ;
Park, Sang Hee Ko ;
Hwang, Chi Sun ;
Yoon, Sung Min .
ACS APPLIED MATERIALS & INTERFACES, 2012, 4 (10) :5369-5374
[2]   Suppress temperature instability of InGaZnO thin film transistors by N2O plasma treatment, including thermal-induced hole trapping phenomenon under gate bias stress [J].
Chang, Geng-Wei ;
Chang, Ting-Chang ;
Jhu, Jhe-Ciou ;
Tsai, Tsung-Ming ;
Syu, Yong-En ;
Chang, Kuan-Chang ;
Tai, Ya-Hsiang ;
Jian, Fu-Yen ;
Hung, Ya-Chi .
APPLIED PHYSICS LETTERS, 2012, 100 (18)
[3]   Crystalline In-Ga-Zn-O Density of States and Energy Band Structure Calculation Using Density Function Theory [J].
Chen, Charlene ;
Cheng, Kai-Chen ;
Chagarov, Evgeniy ;
Kanicki, Jerzy .
JAPANESE JOURNAL OF APPLIED PHYSICS, 2011, 50 (09)
[4]   Self-heating enhanced charge trapping effect for InGaZnO thin film transistor [J].
Chen, Te-Chih ;
Chang, Ting-Chang ;
Hsieh, Tien-Yu ;
Tsai, Ming-Yen ;
Chen, Yu-Te ;
Chung, Yi-Chen ;
Ting, Hung-Che ;
Chen, Chia-Yu .
APPLIED PHYSICS LETTERS, 2012, 101 (04)
[5]   Light-induced instability of an InGaZnO thin film transistor with and without SiOx passivation layer formed by plasma-enhanced-chemical-vapor-deposition [J].
Chen, Te-Chih ;
Chang, Ting-Chang ;
Hsieh, Tien-Yu ;
Tsai, Chih-Tsung ;
Chen, Shih-Ching ;
Lin, Chia-Sheng ;
Hung, Ming-Chin ;
Tu, Chun-Hao ;
Chang, Jiun-Jye ;
Chen, Po-Lun .
APPLIED PHYSICS LETTERS, 2010, 97 (19)
[6]   Low-Temperature Organic (CYTOP) Passivation for Improvement of Electric Characteristics and Reliability in IGZO TFTs [J].
Choi, Sung-Hwan ;
Jang, Jun-Hyuk ;
Kim, Jang-Joo ;
Han, Min-Koo .
IEEE ELECTRON DEVICE LETTERS, 2012, 33 (03) :381-383
[7]   Oxide Semiconductor Thin-Film Transistors: A Review of Recent Advances [J].
Fortunato, E. ;
Barquinha, P. ;
Martins, R. .
ADVANCED MATERIALS, 2012, 24 (22) :2945-2986
[8]   Fully transparent ZnO thin-film transistor produced at room temperature [J].
Fortunato, EMC ;
Barquinha, PMC ;
Pimentel, ACMBG ;
Gonçalves, AMF ;
Marques, AJS ;
Pereira, LMN ;
Martins, RFP .
ADVANCED MATERIALS, 2005, 17 (05) :590-+
[9]   High-Performance Amorphous Indium-Gallium-Zinc-Oxide Thin-Film Transistor With a Self-Aligned Etch Stopper Patterned by Back-Side UV Exposure [J].
Geng, Di ;
Kang, Dong Han ;
Jang, Jin .
IEEE ELECTRON DEVICE LETTERS, 2011, 32 (06) :758-760
[10]   Facilitation of the four-mask process by the double-layered Ti/Si barrier metal for oxide semiconductor TFTs [J].
Hino, Aya ;
Maeda, Takeaki ;
Morita, Shinya ;
Kugimiya, Toshihiro .
JOURNAL OF INFORMATION DISPLAY, 2012, 13 (02) :61-66