High-angle scattering of fast electrons from crystals containing heavy elements: Simulation and experiment

被引:86
作者
LeBeau, James M. [1 ]
Findlay, Scott D. [2 ]
Wang, Xiqu [3 ]
Jacobson, Allan J. [3 ]
Allen, Leslie J. [4 ]
Stemmer, Susanne [1 ]
机构
[1] Univ Calif Santa Barbara, Dept Mat, Santa Barbara, CA 93106 USA
[2] Univ Tokyo, Sch Engn, Inst Engn Innovat, Tokyo 1138656, Japan
[3] Univ Houston, Dept Chem, Houston, TX 77204 USA
[4] Univ Melbourne, Sch Phys, Melbourne, Vic 3010, Australia
来源
PHYSICAL REVIEW B | 2009年 / 79卷 / 21期
基金
美国国家科学基金会;
关键词
crystal structure; Debye-Waller factors; scanning electron microscopy; scattering; transmission electron microscopy; DARK-FIELD IMAGES; MICROSCOPY; CONTRAST; VIBRATIONS;
D O I
10.1103/PhysRevB.79.214110
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The paper reports on quantitative comparisons of experimental and simulated image intensities in high-angle annular dark-field imaging in scanning transmission electron microscopy of a PbWO(4) single crystal. The experimental image intensities are normalized to the incident beam. Provided that the effects of spatial incoherence and multiple thermal diffuse scattering events are taken into account in the simulations, excellent agreement within about 5% is achieved between theory and experiments. The comparisons depend critically on accurate knowledge of the Debye-Waller factors, which were determined by x-ray single-crystal structure refinement, and of the experimental thickness values. The Debye-Waller factors are different for different atomic columns, causing column intensities to not be a simple function of their atomic number. Channeling effects associated with the oxygen columns contribute to intensity variations between the Pb and W columns. The results show that even for single crystals, image simulations are required to correctly interpret the contrast.
引用
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页数:6
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