AtomicJ: An open source software for analysis of force curves

被引：185

作者：

Hermanowicz, Pawel ^{[1
]}

Sarna, Michal ^{[2
]}

Burda, Kvetoslava ^{[2
]}

Gabrys, Halina ^{[1
]}

机构：

[1] Jagiellonian Univ, Fac Biochem Biophys & Biotechnol, Dept Plant Biotechnol, PL-30387 Krakow, Poland

[2] AGH Univ Sci & Technol, Fac Phys & Appl Comp Sci, Dept Med Phys & Biophys, PL-30059 Krakow, Poland

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2014年 / 85卷 / 06期

关键词：

MECHANICAL-PROPERTIES; AFM INDENTATION; ELASTIC-MODULUS; CELLS; CONTACT; MICROSCOPY;

D O I：

10.1063/1.4881683

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We present an open source Java application for analysis of force curves and images recorded with the Atomic Force Microscope. AtomicJ supports a wide range of contact mechanics models and implements procedures that reduce the influence of deviations from the contact model. It generates maps of mechanical properties, including maps of Young's modulus, adhesion force, and sample height. It can also calculate stacks, which reveal how sample's response to deformation changes with indentation depth. AtomicJ analyzes force curves concurrently on multiple threads, which allows for high speed of analysis. It runs on all popular operating systems, including Windows, Linux, and Macintosh. (C) 2014 AIP Publishing LLC.

引用

页数：8

共 37 条

[1] Finite sample thickness effects on elasticity determination using atomic force microscopy [J].