Probing domains at the nanometer scale in piezoelectric thin films

被引：67

作者：

Durkan, C ^{[1
]}

Welland, ME ^{[1
]}

Chu, DP ^{[1
]}

Migliorato, P ^{[1
]}

机构：

[1] Univ Cambridge, Dept Engn, Cambridge CB2 1PZ, England

来源：

PHYSICAL REVIEW B | 1999年 / 60卷 / 23期

关键词：

D O I：

10.1103/PhysRevB.60.16198

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In this article, we describe nanometer scale characterization of piezoelectric thin films of lead-zirconate-titanate. Using the electric field from a biased conducting atomic-force microscope tip, we show that it is possible to form and subsequently image ferroelectric domains. Using the cantilever in resonant mode, we show that it is also possible to map the surface-potential distribution. Using a sphere-plane model for the tip-sample system we calculate the distribution of electric potential, field and polarization charge, and find good agreement with the experimental values. We also discuss the effects of surface contaminants on domain formation. [S0163-1829(99)09947-6].

引用

页码：16198 / 16204

页数：7

共 18 条

[1] Electrostatic forces acting on the tip in atomic force microscopy: Modelization and comparison with analytic expressions [J].