Biaxial probe for nondestructive testing on conductive materials

被引：13

作者：

Bernieri, A ^{[1
]}

Betta, G ^{[1
]}

Ferrigno, L ^{[1
]}

Laracca, M ^{[1
]}

机构：

[1] Univ Cassino, DAEIMI, I-03043 Cassino, Italy

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 2004年 / 53卷 / 03期

关键词：

biaxial probe; digital signal processing; eddy current testing; magnetic transducers; nondestructive testing (NDT);

D O I：

10.1109/TIM.2004.827082

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A biaxial probe for nondestructive testing on conductive materials was set up and tested. Its behavior was investigated at first by using a dedicated simulation environment. Then experimental tests confirm the simulation results and allow better highlighting of the probe effectiveness. The biaxial probe inserted in a previously realized automatic positioning system, operating on a number of specimens of different materials, and with known cracks, proves to be capable of 1) correctly identifying the crack direction and 2) detecting the crack location with an uncertainty contained within the resolution of the automatic positioning system.

引用

页码：678 / 684

页数：7

共 24 条

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