Cat-CVD (hot-wire CVD): how different from PECVD in preparing amorphous silicon

被引:43
作者
Matsumura, H [1 ]
Umemoto, H [1 ]
Masuda, A [1 ]
机构
[1] Sch Mat Sci, JAIST, Tatsunokuchi, Ishikawa 9231292, Japan
关键词
D O I
10.1016/j.jnoncrysol.2004.02.014
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Catalytic chemical vapor deposition (Cat-CVD), often called hot-wire CVD, is a new method to prepare device quality thin films at low substrate temperatures. In this method, deposition species are generated by the catalytic cracking reaction of source gases on the heated catalyzer, instead of the collision between energetic electrons and molecules of source gases in the conventional plasma-enhanced CVD (PECVD). The difference between Cat-CVD and PECVD in generating deposition species causes the differences in both deposition mechanism and the properties of thin films such as amorphous silicon (a-Si). In this review paper, at first, recent understandings on deposition mechanism of Cat-CVD are introduced. Secondly, based on such understandings, unique properties of Cat-CVD a-Si films are explained, and finally their device applications are demonstrated to show the feasibility of Cat-CVD technology. (C) 2004 Published by Elsevier B.V.
引用
收藏
页码:19 / 26
页数:8
相关论文
共 42 条
[1]  
BAUER S, 1997, P 14 EUR PHOT SOL EN, P617
[2]   HOT FILAMENT ASSISTED DEPOSITION OF SILICON-NITRIDE THIN-FILMS [J].
DESHPANDE, SV ;
DUPUIE, JL ;
GULARI, E .
APPLIED PHYSICS LETTERS, 1992, 61 (12) :1420-1422
[3]   PRODUCTION OF HIGH-QUALITY AMORPHOUS-SILICON FILMS BY EVAPORATIVE SILANE SURFACE DECOMPOSITION [J].
DOYLE, J ;
ROBERTSON, R ;
LIN, GH ;
HE, MZ ;
GALLAGHER, A .
JOURNAL OF APPLIED PHYSICS, 1988, 64 (06) :3215-3223
[4]   THE LOW-TEMPERATURE CATALYZED CHEMICAL VAPOR-DEPOSITION AND CHARACTERIZATION OF SILICON-NITRIDE THIN-FILMS [J].
DUPUIE, JL ;
GULARI, E ;
TERRY, F .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1992, 139 (04) :1151-1159
[5]   HOT FILAMENT ENHANCED CHEMICAL VAPOR-DEPOSITION OF ALN THIN-FILMS [J].
DUPUIE, JL ;
GULARI, E .
APPLIED PHYSICS LETTERS, 1991, 59 (05) :549-551
[6]   DEFECT FORMATION DURING GROWTH OF HYDROGENATED AMORPHOUS-SILICON [J].
GANGULY, G ;
MATSUDA, A .
PHYSICAL REVIEW B, 1993, 47 (07) :3661-3670
[7]   Noise reduction of pHEMTs with plasmaless SiN passivation by catalytic CVD [J].
Hattori, R ;
Nakamura, G ;
Nomura, S ;
Ichise, T ;
Masuda, A ;
Matsumura, H .
GAAS IC SYMPOSIUM - 19TH ANNUAL, TECHNICAL DIGEST 1997, 1997, :78-80
[8]  
HEYA A, 1999, 11 INT PHOT SCI ENG, P781
[9]   Transport mechanism of deposition precursors in catalytic chemical vapor deposition studied using a reactor tube [J].
Honda, N ;
Masuda, A ;
Matsumura, H .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 2000, 266 :100-104
[10]   DEPOSITION OF A-SI-H BY HIGH-TEMPERATURE THERMAL-DECOMPOSITION OF SILANE [J].
HORBACH, C ;
BEYER, W ;
WAGNER, H .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1989, 114 :187-189