X-ray detector for diffraction studies

被引：0
|
作者：
Mandelis, Andreas [1 ]
机构：
[1] Univ Toronto, Dept Mech & Ind Engn, Toronto, ON M5S 3G8, Canada
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2014年 / 85卷 / 09期
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D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
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页数：1
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