Zn incorporation in CuInSe2: Particle size and strain effects on microstructural and electrical properties

被引:7
作者
Benabdeslem, M. [1 ]
Bouasla, A. [1 ]
Benslim, N. [1 ]
Bechiri, L. [1 ]
Mehdaoui, S. [1 ]
Aissaoui, O. [1 ]
Djekoun, A. [1 ]
Fromm, M. [2 ]
Portier, X. [3 ]
机构
[1] Univ Annaba, Lab LESIMS, Sidi Amar 23200, Algeria
[2] UFR Sci & Tech, Ctr Microanal Nucl, F-25030 Besancon, France
[3] Univ Caen, ENSICAEN, CIMAP, F-14050 Caen, France
关键词
CuInSe2; doping; zinc; Williamson-Hall; high frequency; CU(IN; GA)SE-2; THIN-FILMS; DEPOSITION; DIFFUSION;
D O I
10.1007/s12034-014-0687-9
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Incorporation of the doping element Zn in the temperature range (550-700 degrees C) and the impact on structural and electrical properties of CuInSe2 material are investigated. X-ray diffraction patterns showed the chalcopyrite nature of the pure and doped CuInSe2 and revealed that diffusion temperature governs particle size as well as tensile strain. The calculated lattice parameters and cell volumes revealed that Zn diffuses in CuInSe2 by substitution on Cu sites. Electrical properties of the material have been investigated using a contact-less technique based on high frequency microwave (HF). It is found that Zn atoms influence the defect equilibrium resulting in the conversion of the conduction type. The conductivity of the samples has been found increasing as the diffusion temperature increases.
引用
收藏
页码:469 / 472
页数:4
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