A refractive index interferometry method based on the X-ray crystallography

The absorption contrast image is very low for those weakly absorbing materials or weak phase object, such as the soft biological tissues, however, the phase item value of refractive index is a thousand larger than the absorption item, therefore the refractive index interferometry method is expected to be a new imaging tool for them. An interferometry method based on the X-ray crystallography is explored to the measurement of refractive index in this paper. The theoretical foundation, the optical design, the crystal transistor performance are the key parts to this interferometry method based on the X-ray crystallography. We give out a special refractive index detection scheme, using a laboratory hard X-ray source, and four single Si crystals. With this instrument, refractive index profile of those weak phase object can be unfolded accurately using this method. This refractive index interferometry method based on the X-ray crystallography will provide a new research tool for those special material properties or biological tissues study. (C) 2014 Elsevier GmbH. All rights reserved.