Overlayer test of surface photoemission effect in Cu(100)

被引:37
作者
Hansen, ED [1 ]
Miller, T [1 ]
Chiang, TC [1 ]
机构
[1] UNIV ILLINOIS,SEITZ MAT RES LAB,URBANA,IL 61801
关键词
D O I
10.1103/PhysRevLett.78.2807
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Angle-resolved photoemission from bulk valence bands of a single crystal yields direct-transition peaks that are often distorted due to interference with broadband indirect emission induced by the surface. The present study is a direct test of this surface effect by using an overlayer to modify the surface boundary condition. A Cu(100) single crystal exhibited a rather asymmetric sp direct-transition peak and a significant indirect emission intensity. Deposition of a thin Ag overlayer shielded the Cu surface from vacuum, and both the peak asymmetry and the indirect emission intensity were suppressed.
引用
收藏
页码:2807 / 2810
页数:4
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