Near-stoichiometric Ti-diffused LiNbO3 strip waveguide doped with Zr4+

被引:4
|
作者
Zhang, De-Long [1 ,2 ,3 ,4 ]
Yang, Xiao-Fei [1 ,2 ]
Zhang, Qun [1 ,2 ,3 ,4 ]
Wong, Wing-Han [1 ,2 ,3 ,4 ]
Yu, Dao-Yin [1 ,2 ]
Pun, Edwin Yue-Bun [3 ,4 ]
机构
[1] Tianjin Univ, Sch Precis Instruments & Optoelect Engn, Tianjin 300072, Peoples R China
[2] Tianjin Univ, Minist Educ, Key Lab Optoelect Informat Technol, Tianjin 300072, Peoples R China
[3] City Univ Hong Kong, Dept Elect Engn, Kowloon, Hong Kong, Peoples R China
[4] City Univ Hong Kong, State Key Lab Millimeter Waves, Kowloon, Hong Kong, Peoples R China
基金
中国国家自然科学基金;
关键词
OPTICAL-DAMAGE RESISTANCE; REFRACTIVE-INDEX; LITHIUM-NIOBATE; WAVELENGTH;
D O I
10.1364/OL.40.005307
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We report a near-stoichiometric Ti:Zr:LiNbO3 strip waveguide fabricated from a congruent substrate with a technological process in the following sequence: Zr4+ diffusion- doping, diffusion of 8-mu m-wide, 100-nm-thick Ti strips, and post-Li-rich vapor transport equilibration. We show that Zr4+-doping has little effect on the LiNbO3 refractive index, and the waveguide is in a near-stoichiometric environment. The waveguide well supports both the TE and TM modes, shows weak polarization dependence, is in single mode at the 1.5 mu m wavelength, and has a loss of <= 0.6/0.8 dB/cm for the TE/TM modes. A secondary ion mass spectrometry analysis shows that the Zr4+-profile part with a concentration above the threshold of photorefractive damage entirely covers the waveguide, implying that the waveguide would be optical-damage resistant. (C) 2015 Optical Society of America
引用
收藏
页码:5307 / 5310
页数:4
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