Test time efficient group delay filter characterization technique using a discrete chirped excitation signal

To measure a filter's group delay in production is never an easy task and to measure the group delay characteristic in quick and timely manner is difficult to say the least. This paper will discuss a simple method that expands on the author's previous works that will demonstrate how to measure the group delay of a filter and how accurately the technique correlates to measurements of the silicon performance made in the lab. The test time saving and stability of results will be shown as well as the advantages of the technique with regard to having full characterization data available in a production program. Finally it will be shown how the work can be further developed to a potentially more efficient technique.