Phase contrast in Simultaneous Topography and Recognition imaging

被引：2

作者：

Fuss, M. C. ^{[1
]}

Sahagun, E. ^{[2
]}

Koeber, M. ^{[1
]}

Briones, F. ^{[1
]}

Luna, M. ^{[1
]}

Saenz, J. J. ^{[2
,3
]}

机构：

[1] CSIC, Inst Microelect Madrid, Madrid 28760, Spain

[2] Univ Autonoma Madrid, Dept Fis Mat Condensada, E-28049 Madrid, Spain

[3] DIPC, Donostia San Sebastian 20018, Spain

来源：

ULTRAMICROSCOPY | 2009年 / 109卷 / 09期

关键词：

Atomic force microscopy; Dynamic force microscopy; Molecular recognition imaging; ATOMIC-FORCE MICROSCOPY; ENERGY-DISSIPATION; ADHESION; AFM;

D O I：

10.1016/j.ultramic.2009.05.009

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The operation of a force microscope in Simultaneous Topography and Recognition (TREC) imaging mode is analyzed by means of numerical simulations. Both topography and recognition signals are analyzed by using a worm-like chain force as the specific interaction between the functionalized tip probe and the sample. The special feedback mechanism in this mode is shown to couple the phase signal to the presence of molecular recognition interactions even in absence of dissipation. (c) 2009 Elsevier B.V. All rights reserved.

引用

页码：1189 / 1192

页数：4

共 25 条

[1] Ultra-sensitive imaging and interfacial analysis of patterned hydrophilic SAM surfaces using energy dissipation chemical force microscopy [J].