Scanning Probe Microscopy for Nanoscale Characterization of Electrical and Magnetic Properties

被引：0
作者：
Maryon, Olivia [1 ]
机构：
[1] Boise State Univ, Boise, ID 83725 USA
来源：
2019 IEEE WORKSHOP ON MICROELECTRONICS AND ELECTRON DEVICES (WMED) | 2019年
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D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：41 / 41
页数：1
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