Self-diffusion in high-purity α-Al2O3: Comparison of Ti-doped, Mg-doped and undoped single crystals

被引:4
作者
Fielitz, Peter [1 ]
Ganschow, Steffen [2 ]
Kelm, Klemens [3 ]
Borchardt, Gunter [1 ]
机构
[1] Tech Univ Clausthal, Inst Met, Robert Koch Str 42, D-38678 Clausthal Zellerfeld, Germany
[2] Leibniz Inst Kristallzuchtung, Max Born Str 2, D-12489 Berlin, Germany
[3] Deutsch Zentrum Luft & Raumfahrt, Inst Werkstoff Forsch, D-51147 Cologne, Germany
关键词
Alumina; Ti-doped; Mg-doped; Tracer diffusion; SIMS; AL-26 TRACER DIFFUSION; SAPPHIRE ALPHA-AL2O3; BASAL SLIP; OXYGEN;
D O I
10.1016/j.jeurceramsoc.2020.07.064
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Oxygen diffusivity in alpha-alumina is characterised by a scatter band of about one decade and a half in an Arrhenius diagram. In order to control decisive material parameters the present study is based on high-purity single crystals which were deliberately doped with aliovalent elements (Mg or Ti) and simultaneously annealed in an O-18(2) atmosphere (200 mbar at 1650 degrees C). In such a crucial experiment the diffusivities in undoped and acceptor or donor doped alumina are identical within a factor of about 2. Contradictory findings in the past on the impact of Mg and Ti on the oxygen diffusion can be rationalised due to published similar calculated energies for the most probable dopant incorporation reactions. Al self-diffusion is much more rapid than oxygen diffusion in undoped and Ti-doped alpha-alumina. In this work we show for the first time that Mg doping drastically reduces the Al diffusivity in alpha-alumina.
引用
收藏
页码:663 / 668
页数:6
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