Mass thickness measurements for dual-component samples utilizing equivalent energy of X-rays

In this paper, equivalent energy method is introduced for measuring mass thickness of dual-component samples using dual-energy X-rays. Approximately, the method adopts equivalent mass attenuation coefficients of the two components in mass thickness measurements for dual-component samples, in a certain range of thicknesses. Feasibility of the method is proven by numerical calculations and Monte Carlo simulations (EGSnrc package). The results of absorption experiments using an X-ray machine at tube voltages of 30 and 45 kV, the relative errors are less than 5% between the nominal and detected values. Also, optical low energy is discussed at given high voltages.