TLP Evaluation of ESD Protection Capability of Graphene Micro-Ribbons for ICs

被引：0

作者：

Zhang, Wei ^{[1
]}

Chen, Qi ^{[2
]}

Xia, Ming ^{[1
]}

Ma, Rui ^{[2
]}

Lu, Fei ^{[2
]}

Wang, Chenkun ^{[2
]}

Wang, Albert ^{[2
]}

Xiel, Ya-Hong ^{[1
]}

机构：

[1] Univ Calif Los Angeles, Dept Mat Sci & Engn, Los Angeles, CA 90095 USA

[2] Univ Calif Riverside, Dept Elect Engn, Riverside, CA 92521 USA

来源：

PROCEEDINGS OF 2015 IEEE 11TH INTERNATIONAL CONFERENCE ON ASIC (ASICON) | 2015年

基金：

美国国家科学基金会;

关键词：

CARBON NANOTUBES; DESIGN;

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Transmission line pulse (TLP) measurements were carried out to study electrostatic discharge (ESD) protection capability of monolayer and bilayer graphene micro-ribbons (GR) as IC interconnects. For 100 ns pulse duration (t(d)) and 10 ns pulse rise time (t(r)), the second breakdown TLP test current density limit reaches around 3.34 x 10(8) A/cm(2) for monolayer GRs and 2.27 x 10(8) A/cm2 for bilayer GRs, which are both superior to that of Cu wires, commonly used as interconnects for CMOS ICs. This study of large number of sample splits provide design guidelines for on-chip ESD protection circuits using graphene interconnects for future ICs.

引用

页数：4

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